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Original question:

PLABS-SAR-EVM-PDK: ??

PLABS-SAR-EVM-PDK: ??

David Hansen
Prodigy 50 points
Part Number: PLABS-SAR-EVM-PDK

Is there a way for the user to define and apply a window shaping pattern to the collected data? Using either "None" or "7 Term B-Harris" is rather limiting.

  • 0
    TI__Mastermind 24258 points

    In older ADC Evaluation Module software interfaces we listed a wide range of windows (e.g. Hann, Hamming). We have found for ADC characterization with a single sinusoidal input frequency that the 8 term Blackman Harris is the most effective at reducing the spectral leakage.  For this reason, we limited the choices to Blackman Harris and no window.  No window was kept in place in cases where coherent sampling is used.

    Art

  • 0 in reply to Art Kay
    Prodigy 50 points

    In the case of coherent sampling, is it possible for me to clock the ADC with an external clock to do the coherent sampling or can the PSI module be configured to coherently sample the 2 kHz test signal? Where can I find this information?

  • 0 in reply to David Hansen
    TI__Mastermind 24258 points

    The PHI (digital controller) has an SMA connector that is intended for a clock input. In the future, we plan on developing firmware to allow for this functionality but presently the firmware / software doesn’t work for this.  The PSI (signal generator) also has the same plan for future development of external clock input for coherent sampling.  Long story short, we don’t have this capability now but plan for it in the future.

    Sorry that I can’t provide this functionality now. One key point: using the 8 term Blackman Harris we are able to achieve very good performance characterization on 18 and 20 bit converters.