Other Parts Discussed in Thread: ADS124S08
I am using ScanMode3: One or more channels Continuous Scan with Burnout Currents, and using 4 channels for conversion. When i switch ON burnout currents and change ODR from 13 sps to 26 sps, the voltage between sig+ and sig- increases by almost 0.5mV and hence the test counts change(they remain stable at that level). When ODR is increased from 53 to 241 sps, the signal voltage and test count increased by 3 times. So the signal voltage increases with increase in output data rate and hence the test counts increase. When i switch off burnout current it works fine. Can this issue be resolved or is this the way it works?
Regards,
Naman