• State Resolved
  • Locked Locked
  • Replies 7 replies
  • Subscribers 34 subscribers
  • Views 324 views
  • Users 0 members are here
Support feedback
Options
Options
Similar topics

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

DS26F31MQML-SP: SEE, SEU, SET?

Furkan Fehmi Sefiloglu
Expert 3118 points
Part Number: DS26F31MQML-SP
Other Parts Discussed in Thread: DS16F95

Hi Team, 

Can we support on DS26F31MQML-SP with SEE, SEU, SET?

Thanks in advance

Best Regards

Furkan Sefiloglu

  • 0
    TI__Guru 69622 points

    Furkan,

    We do not know of any heavy ion testing on the DS26F3x, RS422 transmitter/receiver pair.  There is a paper with SEE data for the DS16F95, which is a RS485 transceiver.  It uses the same process and design elements but the input/output transistors are larger on RS485 products for multidrop applications. If you would like access to this report I can't post it on E2E, but if you google "Single Event and Low Dose-Rate DS16F95" you should be able to find it.

    Regards,

    Eric Hackett 

  • 0 in reply to Eric Hackett
    TI__Expert 3118 points

    Hi Eric, 

    Can you please share the SEE data for DS16F95?

    And also do you think would it be possible to share the history information of these part numbers?

    Thanks in advance

    Best Regards

    Furkan Sefiloglu

  • 0 in reply to Furkan Fehmi Sefiloglu
    TI__Guru 50795 points

    Hi Furkan,

    It looks like the IEEE paper Eric H mentioned contains test results for SEE at the end. Let me know if you have trouble finding it. I'm not sure where the raw data for this testing would be as it was done at an external location several years ago. 

    Could you be more specific about the "history information" you would like for this device? Do you mean previous applications, use cases, previous devices?

    Regards,
    Eric Schott

  • 0 in reply to Eric Schott1
    TI__Expert 3118 points

    Hi Eric,

    Thanks for feedback, yes you are right, please see below the reasoning behind that.

    "

    In the response, it was stated that Heavy ion SEE test was not performed for DS26F31 and DS26F32, and the logic part was the same as DS16F95, but larger transistors were used in the output stage of DS16F95.
    In the table below, it is stated that there will be no SEL effect since DS26F31 is bipolar. However, we do not have a chance to see cross section values or threshold LET values for SET and SEU effects, since SEE testing is not performed.
    In this case, we will not be able to predict how often these components will fail in orbit.
    Would it be possible for you to share the history information of these part numbers?

    "

    Thanks in advance

    Best Regards

    Furkan Sefiloglu

  • 0 in reply to Furkan Fehmi Sefiloglu
    TI__Genius 15345 points

    Hi Furkan,

    Eric is currently out he will be back tomorrow. Expect a response by Monday at the latest.

    Best,

    Chris

  • 0 in reply to Chris Ayoub
    TI__Guru 69622 points

    Furkan,

    I'm working with our internal team on finding more information and will get back to you on Monday (07/19/2021).

    Regards,

    Eric Hackett 

  • +1 in reply to Eric Hackett
    TI__Guru 69622 points

    Furkan,

    This product was first released to an SMD (5962-7802302) in 1991 and the radiation hardened version was released in 1999 (5962F7802302Vxx). I can't share the details, but since then it has been used in many space programs.

    Regards,

    Eric Hackett