Hi team,
If you have an open / short test report for future development, please provide it.
(Short to adjacent pin, short to GND, short to supply, and each pin is open)
Orderable Device : TDP158RSBR
Regards,
Hitoshi Koide
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Hi team,
If you have an open / short test report for future development, please provide it.
(Short to adjacent pin, short to GND, short to supply, and each pin is open)
Orderable Device : TDP158RSBR
Regards,
Hitoshi Koide
Hitoshi
let me check with test engineer and let you know.
Regards,
brian
Sorry for the delay, these tests are tested in ATE test program.
Regards,
brian
Hello Brian,
Thanks for your replies.
I understood that doing an ATE test.
Is there an FMD and Pin FMA information?
Regards,
Hitoshi Koide
Hello Brian,
FMD (Failure Mode Distribution)
Pin FMA (Pin Failure Mode Analysis)
Please refer to the report below.
TCA9517-Q1 Functional Safety, FIT Rate, Failure Mode Distribution and Pin FMA (tij.co.jp)
Regards,
Hitoshi
Hitoshi:
Sorry for the late reply, it's a pretty complex process to create FMA.
Do you know the business case for this customer?
Regards,
Brian
Hello Brian,
Thank you for checking.
I understood the contents.
Business case : Scheduled for product in 2024.
Regards,
Hitoshi