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TLIN1028-Q1: detailed failure mode

user5859485
Prodigy 230 points
Part Number: TLIN1028-Q1

hello:

       I want to use this IC to monitor power. but we have functional safety requirement.

       for the following two items, i want to get detailed failure mode and clear description:

       1. Logic or IO cell fail  ---  10%
       2. Global power or state control fail --- 20%

       I want to get detailed failure mode to calculate FMEDA. 

thank you so much!   

  • 0
    Prodigy 230 points

    sorry for wrong description.

    i want to use this SBC, yeah, not monitor something

  • 0 in reply to user5859485
    TI__Genius 15345 points

    Hi,

    The FMD that you see here is mainly based off of the size of the die and what percentage of the die is made up by the different parts in the table. This is just a percentage chance that if a failure were to occur what is the chance that the failure would be a transmitter fail, receiver fail, etc. We provide more detailed data for our parts that are "Functional Safety Quality-Managed". This part is only "Functional Safety-Capable" so it does not have more detailed data.

    Best,

    Chris

  • 0 in reply to Chris Ayoub
    Prodigy 230 points

    Hello Chris:

            thank you so much!

            As you mentioned,OK. 

           could you help me split it base on die size ? 

           1. Logic or IO cell fail  ---  10%   -------> Logic fail ---xxx% ; IO cell fail ---xxx%   . or every fail is 10%*50%
           2. Global power or state control fail --- 20%    -------> Global power ---xxx% ; state control fail ---xxx% . or every fail is 20%*50%

    by the way, could you help me describe following failure effect?

    Logic fail----> what dose it mean? logic for what?

     IO cell fail---> when i pull down EN pin, EN pin can`t be low, is it IO fail? 

    Global power fail ---> what dose it mean? Will SBC lost function? 

    state control fail ---> can`t transmit into state, EN Pin is low, SBC can`t transmit normal mode into sleep or standby. right?

  • 0 in reply to Chris Ayoub
    Prodigy 230 points

    Hello Chris:

            For the LDO fail, i want to define value of Over Voltage and Under Voltage of LDO output. So, could you help me get value? percentage or value? output is 5.0V. thank you! 

  • +1 in reply to user5859485
    TI__Genius 15345 points

    For the "Logic or IO cell" and "Global Power and State Control" they make up the same part of the die. So there is no way to quantify what percentage make up of that part of the die because they are sharing the same area of the die.

    Logic and IO are the same fail here. This has to deal with any of the logic pins on the device (EN, nRST, TXD,RXD). As you can see the logic block for these pins (threshold, logic control, etc.) are going to be connected to the actual cell that manages the I/O. A fail for this means that your logic I/O pins are no longer functioning as expected. As you said it could mean that when you pull EN low the device does not recognize that low threshold. It could also means that your TXD no longer transmits data on the LIN bus, or RXD no longer shows the correct state of the LIN bus etc.

    Global power relates to the VSUP pin and this could relate to an under voltage detection not working, or some blocks of the device no longer are receiving power etc. It could mean that your SBC is no longer receiving power and therefore it will not be functioning. It all just depends on what the fail is. Keep in mind that when we talk about failures here they don't have to be complete failures of the device. It just means that the specific block of the device is no longer functioning as expected. I highly recommend you look through the failure modes in IEC 61508 and ISO 26262 to see what these failures could entail.

    You have the correct understanding for state control fail. But once again keep in mind that it doesn't have to be a complete failure like you are talking about.

    Best,

    Chris