Other Parts Discussed in Thread: DP83TC811
During the current Ethernet physical layer test of the case, three test items, return loss, mode conversion and common-mode emission, failed
① Ask TI to help evaluate the risk level of Fail, such as whether data transmission will continue to be affected, that is, if data is NG when it is transmitted for the first time, will continuous NG occur in the subsequent consecutive data transmission, resulting in data transmission interruption or transmission failure?
② Check whether the chip DP83TC811 fails. Have other products using this chip also failed physical layer tests?
③ Please also help to evaluate the attached schematic diagram simultaneously