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2N2222

Glenn Studevant
Prodigy 20 points

We are seeing an issue where we are seeing failures in a current measurement test for a transistor and Op Amp circuit that are temperature related.  We see no failures at low temperatures.  As the temperature rises failures begin to occur at about 116 F and continue to increase until we reach a temperature range of just over 130 F where the temperature levels off and failure occurrences drastically reduce.  Are temperature changes typically cause more failures than a constant higher temperature that is still within the defined range of operating temperatures for the part?  We suspect the part that has the failures is a 2N2222.  Do you make heat sinks for that part?  The real issue is a 5 VDC power supply that is mounted to a heat sink plate close to the transistor.  The power supply becomes very hot. We are looking at various options to correct this one is to add a heat sink to the transistor.  Thank you for any advice you can provide.

  • 0
    TI__Guru 71526 points

    Hello Glenn,

      The 2N2222 BJT is not a TI device, therefore, we cannot comment on your inquiry. 

    You will have to find a semiconductor company that produces the 2N2222 for technical assistance. 

    Regards, 

    ~Leonard  

  • 0
    Prodigy 20 points

    I wasn't necessarily referring to the 2N2222 specifically. My question is in general how does change in temperature compare to a steady state high temperature.  Which case is more likely to cause a failure in a transistor or logic device?  A 2N2222 just happened to be a part we use.  It is now obsolete.  It was originally designed by Motorola in the 60s but when I looked up manufacturers TI was listed as one.  I guess that was incorrect.  Thanks for the reply.

  • 0 in reply to Glenn Studevant
    Guru 316940 points

    All electrical components have temperature-dependent characteristics (which are usually shown in the datasheet). It is the duty of the circut designer to ensure that those do not result in failures.

    I cannot say anything specific because I do not know your circuit, or what particular behaviour you consider a failure. If you'd show a schematic with a TI opamp, your question would be on topic here.