• State TI Thinks Resolved
  • Locked Locked
  • Replies 3 replies
  • Answers 2 answers
  • Subscribers 33 subscribers
  • Views 392 views
  • Users 0 members are here
Support feedback
Options
Options
Related

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

ESD122: ESD122 being exposed to X-ray issue

jeno.zhang
Expert 2875 points
Part Number: ESD122

Hi TI,

What will happen to ESD11DMXR devices after being exposed to X-ray for a relatively long time? Is there any damage or change in characteristics?

  • 0
    TI__Mastermind 18010 points

    Hi,

    It could depend on how long the device is exposed. X-ray is commonly used to inspect a devices internal structure, but it is uncommon to do it for an extend amount of time.

    I'm not an expert in this subject, however X-rays are a form of ionizing radiation, so there may be radiation-induced effects overtime. I'm not sure how long it would take for the device to be damaged, but if you're placing it under X-ray for an abnormal amount of time there is a possibility of damage. 

    May I ask what the application is here? 

    Regards,

    Sebastian 

  • 0 in reply to Sebastian Muriel
    Expert 2875 points

    Hi，

    In terms of design theory, is it possible for this chip to be damaged under X-ray irradiation？

    Is the device short circuited or open circuited after failure？

  • 0 in reply to jeno.zhang
    TI__Mastermind 18010 points

    Hi,

    Over a prolonged period of time, it is theoretically possible for the chip to be damaged by X-ray irradiation. The amount of time will depend on how many rad/s the X-ray beam outputs. When the internal MOSFETs are exposed to ionizing radiation, electron-hole pairs are created in the oxide. Electron-hole pair generation in the oxide leads to almost all total dose effects. The generated carriers induce the buildup of charge, which can lead to device degradation.

    To read about this in detail, please see this external resource: Radiation Effects in MOS Oxides. 

    If you're using X-ray to inspect a device, there should be no concern here. X-rays don't emit very high levels of radiation quickly and it typically doesn't take more than 30 minutes to get an image.

    Regards,

    Sebastian