TIR1000: Absolute Maximum Rating of Input Pin

Shinichi-san,

TI cannot guarantee the performance of the device when outside of the absolute maximum ratings, so I wouldn't be able to provide some sort of timing characteristic for this since it was not characterized with any timing considerations when released. In general, unless otherwise mentioned, the absolute maximum ratings for devices apply even for very short time periods.

There is an exception, though: the ESD ratings for a device happen on very short timescales and likely exceed the voltage maximums of the absolute maximum ratings. For this device, it can withstand a ±2000 V HBM strike and a ±900 V CDM strike, both of which are nanoseconds in duration. This serves to answer your question somewhat literally and directly: no, a single overshoot on the order of a few nanoseconds is not likely to immediately damage the device.

However, the reality of application cases is that these events probably happen repeatedly. The ESD ratings for a device correspond to a single strike. Repeated exposure to conditions beyond the absolute maximum ratings will contribute to faster part degradation and may reduce the lifetime of the device (i.e. MTBF). I would strongly suspect this to be the case, rather than any immediate catastrophic damage from the image you shared.

Best,

Danny