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SN65HVD3088E: Two difference lot code had difference performance in the same circuit

Statham Su
Genius 4990 points
Part Number: SN65HVD3088E

Hello Sir:

We are using SN65HVD3088E on our products, their has older lot code and newer lot code.

Please refer below figures,

The older one output voltage is around 2.5V when standby.(ch2)

When old lot code device working, that spike amplitude (pk to pk) is around 4.4V.

The new lot code device output voltage is around 2V when standby.(ch1)

When new lot code device working, that spike amplitude (pk to pk) is around 3.32V.

Please let us know this new lot code device, is it acceptable?

do you have any spec on this pk to pk voltage?

Looking forward your feedback.

Thanks a lot.

  • 0
    TI__Guru 74282 points

    Statham,

    Thanks for bringing this to E2E. I'll look at our internal tools to verify these device codes and get back to you by end of business 10/24/2023 CST.

    Regards,

    Eric Hackett 

  • 0 in reply to Eric Hackett
    Genius 4990 points

    Hi Eric:

    Can you help to update your verify results for us?

    Looking forward your feedback.

    Thanks a lot.

  • 0 in reply to Statham Su
    TI__Guru 74282 points

    Statham,

    These devices were fabricated and assembled at different sites, hence the difference in the outside marking. Let me check if any change documentation is available, and get back to you next week.

    Regards,

    Eric Hackett

  • 0 in reply to Statham Su
    TI__Guru 52292 points

    Hi Statham,

    So  is this behavior causing  problems in the system? 

    This IC did go through a redesign  about a 1.5 years ago it looks like - while no major changes in performance were found, the die is completely different and what we have found is some impedance values that we do not directly specify change due to the redesign which could result in the changes that you are seeing above  - generally in the vast majority (like 99.9% of cases) of applications these are marginal differences and don't end up causing system level issues - just a slight difference in performance at a part level. 

    Please let me know if this is causing any issue in your application  - or if it is just a change that you are seeing. As this does seem to line up pretty well with other cases we have seen due to some recent part redesigns of older devices. 

    Best,

    Parker Dodson