Other Parts Discussed in Thread: USB2ANY
Hello Lucas,
This thread is for Lanner's DS100DF410.
I open a thread at public forum is that Lanner will also follow on this case through E2E with you, thanks.
After trying and error to fine tune the SoC NXP TX pattern through the retimer to measure SI; below are the measuring results.
The NXP TX pattern waveform has been tried with the best configuration, you may see the waveform is better than through retimer one.
Lanner has been fine tuned the retimer amplitude/ de-emphasis by SW, but it seemed no response from the settings.
Furthermore, they’ve consulted SI engineer about the XFI SI measuring issue of TI retimer, it was once fine-tuned by TI US FAE, which is by EEPROM setting via retimer EVB with SigCon tool.
A few questions need to resolve:
- Does EEPROM is the MUST with DS100DF410?
- Why original TX pattern waveform is better than retimer output? How to fine tune it?
Looking forward your reply soon, thx.
Best Regards,
Dave