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SN55LVDS33-SP: TID test and wafer lot

Part Number: SN55LVDS33-SP

To Whom It May Concern,

Hope you're well.

Please allow me to submit inquiry as below for the P/N 5962-0724801VFA

<Inquiry>

A customer is considering purchasing SN55LVDS33-SP(5962-0724801VFA).

The TID test data is posted on the website, but will the wafer lot of the product I will be purchasing be the same wafer lot "7083971" as the one used during the test?snaa252.pdf

07248.pdf

Thank you so much for your attention and kind support.

Kind Regards,

Yohei Kusachi

  • Kusachi-san,

    I've notified a member of our high-reliability team to address this question. Thank you for your patience.

    Regards,

    Eric Hackett 

  • Hello Yohei-san, 

    Happy New Year! It's great to hear from you again - I hope you are doing well. 

    SN55LVDS33-SP / 5962-0724801VFA is a QML-V, non-RHA (Radiation Hardness Assured) device. This means we do not do radiation lot acceptance testing for each wafer lot (per MIL-PRF-38535). 

    Unfortunately we do not have any material left from wafer lot 7083971, so the material purchased will come from a different wafer lot. TI is considering a RHA version of this device in the future, meaning we would complete TID testing for each new wafer lot per MIL-PRF-38535. 

    Thanks, 

    Shannon

  • Hello Eric-san and Shannon-san,

    Hope you are all well and thank you so much for your kind support and warm consideration for this inquiry.

    (and Happy New Year!)

    Yes, I do understand P/N: 5962-0724801VFA is QML-V though is non-RHA and will not be needing radiation lot acceptance testing per MIL-PRF-38535.

    Are there any reason for TI kindly uploading TID report on TI.com though this device is non-RHA?

    (I believe customer got confused since TID report is on TI.com)

    Is it may be for reference only?

    Also, would it be possible for you to kindly provide us TID report for the current wafer lot or the lot if we specify?

    It'll be great if you could kindly advise.

    Thank you again for your kind support.

    Kind Regards,
    Yohei Kusachi

  • Hello Yohei-san, 

    In most cases we will still do a one-time TID characterization for a space-grade product, even if it's non-RHA. This is similar to our one-time SEE characterization that is done for the majority of our space-grade products as well. 

    Unfortunately we are not able to provide TID reports by wafer lots at this time. However, we are considering a RHA version of this device for future release. 

    Thanks, 

    Shannon Lippincott

  • Hello Shannon-san,

    Thank you so much for your kind reply in detail.

    Please have a great rest of your day.

    Thank you again!

    Kind Regards,

    Yohei Kusachi