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THVD9491-SEP: Single Event Effects test report

Part Number: THVD9491-SEP


Hello, I am inquiring today about the Single Event Effects test report for the THVD9491-SEP to see if this is available as I was not able to locate it on the product page. Thanks.

  • Hi Christian,

    This device has not officially released to market (RTM). I believe the RTM date is expected somewhere in September this year, usually when the part RTM's the document you are asking for will also be published online at the same time. Internally, it seems like we're working to complete this testing. If it's urgent we may be able to provide an unofficial report (it wouldn't be in document format).

    -Bobby

  • Hi Bobby, thanks for the info. If you could share the unofficial report, that would be great, but maybe you can answer this question for me. The datasheet lists that this part is SEL-immune to 43 MeV-cm^2/mg and I was wondering if this part was tested to any higher LET values or did the testing stop at LET = 43 MeV-cm^2/mg?

    Thanks!

  • "THVD9491-SEP was tested at the Facility for Rare Isotope Beams (FRIB) FSEE facility using the Xe ion at 25 MeV/u > LETEFF = 50.5 MeV. We tested three units for SEL (three runs each) at 50.5 MeV and all nine runs passed. "

    For any unofficial reports, we would need to discuss offline and evaluate the need to share the information early... 

    Can you reach out to me at duynguyen@ti.com and I can try to loop you in with the correct contacts?

    -Bobby