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DS25CP114: Questions about DS25CP114TSQE/NOPB

michihiro akashi
Prodigy 180 points
Part Number: DS25CP114

Tool/software:

Hello teams

I appreciate your continuous support.
I would like to ask a question about the following TI device.

Target device: DS25CP114TSQE/NOPB

The device of five DS25CP114TSQE/NOPB are mounted on a board that is an our ASIC evaluation board.
Three of them failed (probably at the same time) during operation, causing a short circuit between the power supply (VDD) and GND within the device.
I would like to investigate the cause of this problem, so I would like to ask/consult about the following three points.

①What do you think could be the cause of this device failing and causing a short circuit between the power supply and GND?
(It is possible that an irregular voltage was applied to this device due to a work error during the evaluation of the ASIC, but under what conditions could the power supply and GND be shorted?)

②Is it possible for the power supply and GND to be shorted due to failure due to aging of the device?
(The board in question was manufactured in 2018, so the device was manufactured before that.)

③Is it possible to analyze the failed device and determine the cause?

In particular, if it is deterioration due to aging, we are concerned that previously manufactured boards will suffer frequent failures in the future,
so we are asking this question to allay our concerns.

Thank you for your confirmation.

Best regards

  • 0
    TI__Guru* 93670 points

    Greetings,

    1). As you noted, voltages above data sheet limits may have caused this failure.

    2). Answer is no and this is very unlikely. 

    3). I believe you mentioned two out of five devices are working with no problem. You can continue using these two parts for extended time just to make sure aging is not the root cause. You can use your voltmeter and measure impedance between GND and VCC pins. Do the same measurement for good devices and compare with non-functional parts.

    Regards, Nasser

  • 0 in reply to Nasser Mohammadi
    Prodigy 180 points

    Thanks your response.

    Your explanation really helped that it is not due to deterioration over time.

    And we checked that the pins between Vcc and GND are shorted.

     

    I’ｍ not sure why short phenomenone happened.

    Is it cause of failure due to exceeding the rating due to overvoltage or overcurrent?

    I want to know specifically what phenomenon occurred.

     

    Q1. Do you have any comment avobe question?

    Q2. Have you ever dealt with a device failure similar to this one?

    If you have experience dealing with it, I would like to know the cause of the failure as reference information.

     

    Best regards

  • 0 in reply to michihiro akashi
    TI__Guru* 93670 points

    Greetings,

    Typically this could be due to electrical over stress. You can compare impedance of VCC to GND for good vs bad part. It is possible ESD event may have caused this.

    Regards, Nasser

  • 0 in reply to Nasser Mohammadi
    Prodigy 180 points

    Hello,

    So far, I believe you have answered that the cause of the failure was ESD.
    Could you please explain a bit more about why the cause of this failure was not deterioration over time?
    People within the company have asked whether it is possible for all three to fail at the same time due to ESD.

    Is ESD the likely cause for all three to fail at the same time?
    If the failure is due to deterioration over time, what would be the failure mode?

    Best regards,

  • 0 in reply to michihiro akashi
    TI__Guru**** 176721 points

    Hi,

    Due to the US Labor Day holiday, the response to your question may be delayed. We will look into your question when we return tomorrow, Sept 3rd. Sorry for the wait and any inconvenience it may cause.

    Thanks,

    David

  • 0 in reply to David (ASIC) Liu
    TI__Guru* 93670 points

    Greetings,

    1). We typically do not see this type of issue related to aging.

    2). Yes it is possible due the electrical over stress like ESD event these devices get damaged. ESD is one of the causes of the electrical over stress. It would be power supply voltage rail causing this.

    3). To confirm if this is electrical over stress like ESD, device has to go through failure analyses. 

    Regards, Nasser

  • 0 in reply to Nasser Mohammadi
    Prodigy 180 points

    Hello,teams

    Understood. I will send you a sample so could you analyze it?
    Please check (with X-ray) which part of the internal circuit is broken and confirm whether it is really ESD or not.
    Could you please check 3 pcs?

    Best regards

  • 0 in reply to michihiro akashi
    TI__Guru* 93670 points

    Greetings,

    Please contact your local TI sales/quality group so you can send sample for analyses.

    Regards, Nasser

  • 0 in reply to Nasser Mohammadi
    TI__Intellectual 2681 points

    Hi Nasser-san,

    Thanks for your support. For the analysis the quality group judged if they accept the samples or not.

    I will take over this case. Please close this question

    regards,

    Shoo