Other Parts Discussed in Thread: OPA4277-SP
Tool/software:
Hello,
I am currently evaluating the SN55HVD233-SP (5962L1420901VXC) for a space application that requires high reliability in a radiation-exposed environment. While the datasheet provides detailed information on the total ionizing dose (TID) tolerance, I could not locate specific data regarding the device’s susceptibility to Single-Event Effects (SEE), particularly Single-Event Latchup (SEL) and Single-Event Upset (SEU).
I would appreciate any additional information or education on the topic in either radiation characteristics or SEE immunity by design if appropriate.
Thank you!