This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

TIOS1023: TIOS1023 behavior after surge test

Part Number: TIOS1023

Tool/software:

Team,

I would like to ask few questions about the TIOS102x chip specifications.

 

From the datasheet:-

“The VCC and OUT pins of the device are capable of withstanding up to 1.2 kV of 1.2/50 – 8/20 μs IEC 61000-4-5 surge with a source impedance of 500 Ω.”

This statement is same as TIOS101x existing chip using.

 

During +1kV Surge test apply on OUT pin, the questions are:

1. What’s the behavior on the chip

Does it enter Current Fault Detection mode & NFAULT output Indication?

 

2. If Yes, does it follow the timing switching characteristics as shown below?

It means OUT pin need to wait for “NFAULT driver re-enable wait time + max. of OUT re-enable delay after UVLO” timing, total needs about 65ms to recover the output?

3. Is there any solution that it won’t enter Current Fault Detection mode & NFAULT output Indication during +1kV Surge test?

4. Is there any TI testing report for this Surge test?

Thanks,

Frank

 

If have any difficulties to answer it, then kindly let me know later

  • Hi Frank,

    Our surge testing pass/fail criteria is related to survivability and devices are screened before and after the surge testing and a shift analysis of all the parameters is performed to check for any damage.  I don’t believe we have any data collected for monitoring the device operation during the surge event because it is generally assumed there will likely be some communication disruption so I can’t directly answer the questions.  But if the surge pulse results in an over-current condition, or an OV/UV condition based on the datasheet specification then yes, the NFAULT and possible driver re-enable wait time may occur.

    Regards,

    Jonathan