Tool/software:
Hi TI,
I am working with the TDES960 deserializer and attempting to generate a test pattern. I have successfully configured the device to output a YUV422 - 8-bit test pattern.
Currently, I am using bits 6:7 (PGEN_CSI_VC) in the PGEN_CSI_DI register to select the virtual channel for the test pattern. This allows me to generate the test pattern on one virtual channel at a time (VC0, VC1, VC2, or VC3).
However, I've encountered an issue when attempting to open more than one virtual channel concurrently. For example, if I open VC0 and get the expected test pattern, then proceed to open VC1 without closing VC0, the previously opened VC0 produces an uncorr_err (no frames are received), while VC1 successfully generates the test pattern.
My goal is to generate the test pattern simultaneously on all four virtual channels (VC0, VC1, VC2, and VC3) without this error occurring on the previously opened channels.
Could someone please advise on the correct register configuration or method to enable the test pattern generation on all four virtual channels concurrently and avoid this uncorr_err?
Any guidance or examples would be greatly appreciated.
Thank you for your time and assistance.
Best regards,
