Tool/software:
Dear Texas Instruments Space Products Team,
I hope this message finds you well.
We are currently conducting a MIL-HDBK-217F based reliability analysis (Parts Stress Method) for a space-related defense application and are considering the use of the THVD9491-SEP device in our design.
The purpose of this request is to obtain TI’s recommendation for the appropriate πQ level of the THVD9491-SEP device based on its screening and qualification history, in accordance with MIL-HDBK-217F.
We would also appreciate receiving the supporting rationale or documentation that justifies this πQ classification.
To support this, we kindly request the following information for THVD9491-SEP:
1. Screening and qualification test summary (including Burn-in, LAT, Electrical Tests, etc.)
2. Any available documentation indicating screening levels equivalent to MIL-STD-883 (if applicable)
3. Radiation test results (TID, SEE, SEL) or corresponding RLAT summary
4. Certificate of conformance (CoC) or process flow, if available
We appreciate your support and look forward to your response.
