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AM26LV32E: Varying Impedance Across Pins - different date codes

Part Number: AM26LV32E

Tool/software:

Hello team - can you help with the below question from the customer, thank you! A few things that we have brainstormed - manufacturing change? Second site qual'ed? Any insight here is appreciated!

We are having impedance discrepancies when measuring these parts across neighboring pins. On older lot codes, it’s essentially an open. On the 2515 date code, we have 10% of the anticipated impedance. Please note that these were measured in-circuit; not unprocessed parts. Please also note that we processed multiple batch lots consecutively through SMT without changing other components or process parameters.

 

The parts currently on the boards read 40k, but they should measure approximately 450k. I verified this by checking multiple boards and reviewing previous passing test data. It appears that the affected components are from the 2515 date code batch.

 

Does TI have information on what impedances should be when measuring across pins? i.e., Pin 1 to 2, 2 to 3, et cetera.

 

  • Hi Alex,

    We released a PCN for this device in end of 2023. The PCN states we introduced a new die and are obsoleting the old one. 

    PCN20230814006.1 AM26CLV32E.pdf

    New die has a new design may not have the same impedance reading during ICTs. This is likely due to the newer ESD cells that may conduct during the ICT and provide lower readings. The customer will need to recharacterize our device in their system to set new limits for the ICT. 

    We don't characterize the impedance values for our device so we can't provide guidelines since the impedance values will move with the test equipment's output voltage (higher voltage, means more leakage through the ESD cells).

    -Bobby