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DS90UB941AS-Q1: Question about measuring margin using ALP program

Chase Jeong
Mastermind 8295 points

Part Number: DS90UB941AS-Q1
Other Parts Discussed in Thread: ALP, , USB2ANY

Tool/software:

Dear TI experts,

My customer try to measure margin of DS90UB941AS-Q1 in their own PCB using ALP program.

First they used USB2ANY to coonect their PCB to PC.

And they checked that DS90UB941AS-Q1 is detected well in ALP program, and select deserializer, and did margin test.

They used the cable below. 1m and 2m cable are reached same results.

LD5-101-XXXX-Y-Y.pdf

Could you check thst this procedure and results are right or not?

Please check this issue. Thanks.

Best regards,

Chase

  • 0
    TI__Genius 15040 points

    Hi Chase,

    Just a small discrepancy with your block diagram, the USB2ANY should be attached to the 940 to run MAP, which looking at the screenshot, it is, so that's fine. 

    Based on the procedure, it seems like they're doing it correctly. Are they following the steps here -

     MAP.pdf

    MAP tests the entire link between the SER and DES, so it looks like they have good margin for the tested strobe and EQ margin.

    In normal operation though, the EQ level and strobe position are set automatically as part of the Adaptive Equalization (AEQ) process. 

    1m, 2m cables are pretty short, so if they are new cables, and their layout between the SER and DES is good, then I would expect passing results for most strobe and EQ margin. If you want to be extra confident though, you can raise the dwell time to give more time for each combination of EQ/SP.

    BR,

    Esther

  • 0 in reply to Esther Chang
    Mastermind 8295 points

    Dear Esther,

    Thank you fory our support.

    My customer did more test using their own cable which soldered 2 different cables to make longer.

    And they got a result as below.

      

    Do you think it is acceptable result?

    Please check this issue. Thanks.

    Best regards,

    Chase

  • 0 in reply to Chase Jeong
    TI__Genius 15040 points

    Hi Chase,

    This is fine. We recommend having a a margin of 3 passing EQ levels and 4 strobe positions, including a contiguous rectangle of passing states that measures two EQ levels by four strobe positions, and in both cable lengths, this is observed. 

    BR,

    Esther

  • 0 in reply to Esther Chang
    Mastermind 8295 points

    Dear Esther,

    Thank you for your support.

    My customer still tests with various situation.

    During the tests, My customer have a question about test method.

    - In real car, device will face many bad situations like high temperature, damaged cable, vibration, etc.

    Is there any way to test like these bad conditions using MAP by setting the parameters in the MAP?

    Best regards,

    Chase

  • 0 in reply to Chase Jeong
    TI__Genius 15040 points

    Hi Chase,

    You can't set the parameters in MAP, but you can stress test the chip and while stress testing, you can run the MAP analysis. 

    BR,

    Esther

  • 0 in reply to Esther Chang
    Mastermind 8295 points

    Dear Esther,

    Thank you for your support.

    Do you have any steps or procedures for stress test using TI's program or other GUIs?

    Customer do not have any idea because it is the first time for this kind of test.

    Please check this issue. Thanks.

    Best regards,

    Chase

  • 0 in reply to Chase Jeong
    TI__Genius 15040 points

    Hi Chase,

    The stress test is usually the decision of the customer. Depending on the condition they expect the chip to experience, they could set up their test.

    We have some guidelines about ESD, recommended operating conditions, temperature conditions, etc...that you can use to design your stress test. 

    The 941as is also functional safety-capable, which comes with its set of requirements. Please reach out to a local FAE to request functional safety documentation. 

    There's some documentation to help with 941as bring-up listed under the technical documentation tab here - https://www.ti.com/product/DS90UB941AS-Q1 

    BR,

    Esther