SN65176B: Long term reliability of SN65176B when powered with 3.3V instead of 5V

Part Number: SN65176B


Tool/software:

We recently discovered a manufacturing issue on one of our RS-485 boards, where the SN65176B transceiver was inadvertently populated and powered from a 3.3 V rail instead of the intended 5 V.

Despite being outside the specified 4.75 V – 5.25 V operating range, initial functional tests indicate that communication appears to function correctly at room temperature. However, we are concerned about the long-term reliability and possible latent degradation of these devices due to prolonged undervoltage operation.

Could you please clarify:
1. Whether continuous operation at 3.3 V may cause accelerated wear, latch-up susceptibility, or threshold drift in the SN65176’s driver/receiver circuits.
2. If there are any internal protection or bias networks that might behave unpredictably under such undervoltage conditions.
3. Whether TI has any empirical or qualification data on devices operated below the minimum VCC rating (e.g., failure rates, parameter drifts, or reliability test results).

Our goal is to assess the reliability of these units. Any insights on electrical margin, long-term degradation mechanisms, or risk of field failure at 3.3 V operation would be greatly appreciated.

  • Hi Nik,

    1. Whether continuous operation at 3.3 V may cause accelerated wear, latch-up susceptibility, or threshold drift in the SN65176’s driver/receiver circuits.

    Low voltage usage of a device doesn't normally cause accelerated damage/wear on devices. Generally FIT rates speed up when devices are used at higher voltages and high temp.

    . If there are any internal protection or bias networks that might behave unpredictably under such undervoltage conditions.

    From the validation specs that I was able to look up for the new designed version, it looks like there is an UVLO rising on Vcc. The max found was just under 3V. So you need to ensure your supply goes above 3V (3.3V-10% is 3V which is kind of close). UVLO falling is closer to 2.5V

    Whether TI has any empirical or qualification data on devices operated below the minimum VCC rating (e.g., failure rates, parameter drifts, or reliability test results).

    TI doesn't test/validate devices outside of the recommended operating conditions. So we don't have any data on this.

    -Bobby