BQ40Z50-R2: Fuse failure with SOTC parameter, is TSint taken into account like TS1-4

Part Number: BQ40Z50-R2
Other Parts Discussed in Thread: BQ40Z50

Hello,


Regarding the use of protections and permanent fails in the context of temperature, I have a question about the detection and action taken on the fuse with respect to the TSInt variable.

I am using the 4 cells and the internal temperature (activated).

- In the settings, when referring to the cells, cells 1-4 are specified in several paragraphs, but also the internal temperature "TSInt", which suggests that TS1-4 and TSInt may have an internal "link" for FW processing.

- TS1-4 explicitly refers to the cells, while TSInt is an internal chip temperature, the use of which is unrestricted.

- In the protection configuration, SOTC and SOTF are differentiated for the cells and the FET, but TSInt is not specified.

I recently experienced an unexplained fuse blown (no cell-related event) with an active PF, and according to the log history, I had a "high" internal TSInt temperature that corresponds to the cell threshold. This internal temperature (i.e., the chip) is on a PCB that integrates the charge converter (which therefore heats up), but is not directly related to the cell temperature. I am therefore wondering if the TSInt temperature could be interpreted in conjunction with the TS1-4 cell temperature in the SOTC configuration?

Regards

CM