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TUSB8041A: Regarding Fast Transient/Burst Testing (EN61000-4-4)

Kyohei
Genius 3141 points

Part Number: TUSB8041A

Hi team,

My customer is evaluating the TI TUSB8041A for adoption. During the evaluation, an issue has arisen in the Fast Transient/Burst test (EN61000-4-4) where the USB 2.0 signal lines exhibit malfunctioning behavior. Could you please review the following details?

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We are currently using the TI TUSB8041A on a CPU board under development. When performing the Fast Transient/Burst test (EN61000-4-4), a failure occurs on the USB 2.0 signal lines.

Details: A USB cable and a USB 3.0 memory stick are connected to the USB port on the CPU board. When 1kV noise is applied to the USB cable at 5kHz for one minute, the USB port is recognized as USB 3.0, but no longer recognized as USB 2.0. (Note: USB 2.0 functionality was confirmed prior to the test.)

This issue has occurred on 2 out of 3 units tested. Could you please check with TI if this issue has been reported before? If so, are there any known countermeasures?

Additionally, we would appreciate it if you could provide recommended values for common mode chokes and ESD diodes for the USB 2.0 signal lines.

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We would also like to share the schematic data of the board under development for your review. Could the person in charge please send me a friend request so I can send it via private message?

Best regards,

Kyohei