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TLIN2021A-Q1: Transceiver Damage during Fault injection

Part Number: TLIN2021A-Q1
Other Parts Discussed in Thread: TLIN4029A-Q1

Hi Team

-Are there internal ESD/clamping differences between VSON8 and SOIC8 packages?
-What is the LIN pin’s voltage tolerance under repeated short‑circuit to 54 V?
-Can you share diode trigger/snapback data for TLIN2021?
-What is the likely failure mechanism (thermal, diode breakdown, latch‑up)?
-Do you have any referance proved design?
-Do you recommend external protection (TVS, series resistor) for 48 V systems? 

 

 

 

  • Hi Ramya,

    1. There should be no such differences and the abs max ratings specified in the data sheet should be absolute for both. However, VSON packages may often have lower inductance which can help with the layout level ESD performance but not different die level clamp thresholds.

    2. 60 V as specified in the data sheet. If damaged, this more than likely implies transients > the applied 54 V and more than the specified 60 V was observed on the IC pin, most likely due to inductance on the bus.

    3. Unfortunately, we cannot and recommend utilizing the information specified in the data sheet at all times.

    4. Most likely overvoltage above the abs max ratings similar to 2.

    5. Unfortunately, the data sheet is strongly recommended as staying within the limits would help in mitigating such damages. May also include series resistors for faults, TVS diodes at the connector, proper grounding etc.

    6. Yes, and would also recommend a device with abs max ratings above ISO's 48 V upper limit I.e., see TLIN4029A-Q1 rated up to 70 V, thanks.

    Best Regards,

    Michael.

  • Hi Michael
     Thanks for the response.
    Is there a LIN transceiver that is 70V Capable and has wakeup and INH pin options?

    TLIN4029A-Q1 is not having those options

  • Hi Veena,

    Unfortunately, not as of this time.

    However to see if feasible, could you help share more information on the business use-case, OEM, timeline and volume? Thanks.

    Best Regards,

    Michael.