Part Number: TUSB522P
Hello:
At present, during EOS testing in a project, there is an issue where the USB flash drive cannot be recognized. When testing EOS (8/20us surge waveform, coupling method:+pole capacitor/diode, - pole capacitor/inductor) to+8V with RX signal to ground, this problem occurs.
What is the self-protection capability of this Redriver chip model TUSB522PIRGER? Need to provide individual TLP and EOS (for RX/TX signal to ground),Thanks!!!
Hi Vishesh:
At present, when using RX.TX signal to ground, there may be IC hard loss. From the USBA interface, after passing through TVS 3.3V Vrwm and series resistance 5.1, I tried to change the series resistance to 12.1ohm, but it did not improve. At the same time, I replaced the 4-channel TVS 3.3V with 1.5V Vrwm+12.1ohm, but the series resistance still did not improve. 8V showed hard loss.
The EOS document is as follows:
Test conditions:
Test waveform parameters: 1.2/50 μ s (voltage waveform)&8/20 μ s (current waveform) Combined wave:
Test polarity:+/-
Test frequency: 5 times for each polarity and voltage level;
Test voltage: From low to high until damaged. Starting voltage: 6V, step voltage: 1V
Test steps:
1. Surge signals are injected from signal lines (D+, D -, TX+, TX -, RX+, RX -, Vbus) and ground;
2. Perform surge testing starting from 6V. Step by 1V, test to 12V, and measure the terminal to ground resistance each time to compare whether there is a significant change compared to before the test.
3. Positive and negative polarities are tested 5 times each, with an interval of 5 seconds. For positive polarity surges, diode decoupling is used, and for negative polarity, inductor decoupling is used. The prototype has been tested to exhibit functional abnormalities or significant impedance changes (exceeding 50%).
4. Record this voltage.
The testing instruments are as follows:,
Equipment model: TVS8/20TC
