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DP83869EVM: DP83869EVM: Clarification of suitability as golden device / link partner for 10BASE-Te, 100BASE-TX and 1000BASE-T compliance testing

Nakgawa Shion
Prodigy 10 points

Part Number: DP83869EVM

Hi TI team,

I am currently considering purchasing the DP83869EVM.

My intended use is to evaluate whether this board can be used as both a golden device and a link partner for Ethernet electrical compliance testing of 10BASE-Te, 100BASE-TX, and 1000BASE-T.

I am asking this because the DP83869EVM product page states that the EVM supports copper Ethernet protocols such as 10BASE-Te, 100BASE-TX and 1000BASE-T, and also states that it supports interoperability testing, compliance testing and BER testing.

www.ti.com/.../DP83869EVM

However, after reviewing SNLA239D and the E2E thread below, I am not clear whether DP83869EVM officially supports the full set of 1000BASE-T compliance-related test modes required for this intended use, especially Test Mode 3 / slave jitter unfiltered:

https://e2e.ti.com/support/interface-group/interface/f/interface-forum/1539738/dp83869evm-etherent-complience-test--jitter-salve-unfiltered

In that E2E thread, TI states that:
- DP83869EVM does not support slave jitter unfiltered test
- TX_TCLK cannot be provided externally without additional internal jitter
- indirect Test Mode 3 does not give conclusive test result

Also, in SNLA239D, Appendix B does not provide a Test Mode 3 script, and the document states that slave jitter testing cannot be conducted.

Therefore, I would appreciate an explicit official clarification on the following points:

1. Can DP83869EVM officially be used as a golden device for Ethernet electrical compliance testing across 10BASE-Te, 100BASE-TX, and 1000BASE-T?
2. Can DP83869EVM officially be used as a link partner for those same test activities?
3. For 1000BASE-T specifically, does DP83869EVM officially support Test Mode 3 / slave jitter unfiltered?
4. If Test Mode 3 is not officially supported, should the product-page wording be interpreted as supporting only selected compliance tests rather than full compliance coverage?
5. If there is any official limitation document or statement that defines this restriction, could you please point me to the exact document and section?

This clarification is important because it directly affects my purchase decision and my evaluation plan.

Best regards,
Shion Nakagawa 

  • 0
    TI__Mastermind 26771 points

    Hi Nakagawa-san, 


    Nakgawa Shion said:
    1. Can DP83869EVM officially be used as a golden device for Ethernet electrical compliance testing across 10BASE-Te, 100BASE-TX, and 1000BASE-T?

    Yes

    Nakgawa Shion said:
    2. Can DP83869EVM officially be used as a link partner for those same test activities?

    Yes


    Nakgawa Shion said:
    3. For 1000BASE-T specifically, does DP83869EVM officially support Test Mode 3 / slave jitter unfiltered?
    4. If Test Mode 3 is not officially supported, should the product-page wording be interpreted as supporting only selected compliance tests rather than full compliance coverage?

    We do not support test mode 3 because we do not expose TX_TCLK directly to the IO pins. However, slave jitter unfiltered can be conducted using test mode 2 and 4 signals. This is just an informative test, however. Passing this test is not required for the PHY to be Ethernet certified since not all PHYs support TX_TCLK being exposed to the IO pins. 

    Nakgawa Shion said:
    5. If there is any official limitation document or statement that defines this restriction, could you please point me to the exact document and section?

    There is no documentation but please feel free to refer to IEEE 802.3 specifications. 

    Best,
    J

  • 0
    Prodigy 10 points

    Hi J,

    Thank you for the clarification.

    I understand that DP83869EVM can pass required certification tests
    using alternative methods, but does not provide Test Mode 3
    as a native compliance test mode.

    For my use case, I will proceed with an evaluation platform
    that officially supports all IEEE 802.3 1000BASE-T test modes.

    Best regards,
    Shion Nakagawa