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SN65HVD74: End of Line Test

muhammad kamil
Prodigy 10 points

Part Number: SN65HVD74

I am bulding a quality database to cover recommended part no "SN65HVD74" to be used on future design and would like some information on how Texas Instruments Ic are monitored for conformance. Is there an end of line test that each manufacturing lot must pass to demonstrate conformity with datasheetspecification and what sample size is taken for this testing?

Or is there another method used to monitor for component specification drifting over time?

Thanks for your time,

Muhammad Kamil

  • 0
    TI__Guru* 80691 points

    Hi Muhammad,

    We do have automated test program that is run across all of our devices after they are assembled. This test does test datasheet specs but may not cover 100% of them and may include specs outside of the datasheet. 100% of devices will go through this test program and some may be scrapped if they fail any of the sequences. 

    TI does treat this automated test program with confidentiality and does not provide customers with what is actually being tested. 

    muhammad kamil said:
    Or is there another method used to monitor for component specification drifting over time?

    We don't run testing for silicon aging. My understanding is that this kind of thing varies with what kind of environment the component is put in and what kind of stress they see when in use. A device that sits in a temperature controlled room that actually drives a load maybe once every few minutes will see different drift than that which is set close to its max operating temperature range and is constantly driving a load for its full life cycle.

    -Bobby