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TCAN4550: Test Register function in Test Mode

AP
Intellectual 530 points

Part Number: TCAN4550

Hello,

we are using the TCAN4550 in Test Mode with TEST_MODE_CONFIG = 1 (so GPO2 acts as TXD to and GPIO1 acts as RXD from an external transceiver).

In this mode, should the Test Register at 1010h be functional to set the GPO2 = TXD device pin? E.g. Test Register has been set (and read back) to be 000000C0h, but we don't see any change (no dominant level) on the GPO2 pin. It seems m_can_tx is not the same as TXD_INT_CAN?

Thanks

  • 0
    TI__Mastermind 36841 points

    Hello AP,

    Yes, the MCAN Test Register 0x1010 should be functional.  Do you have an external transceiver connected to the GPO2 and GPIO1 pins?  Could you provide some more information about your test configuration?

    Please read back the final values for the following registers:

    0x0800

    0x1018

    0x0820

    0x1050 or 0x0824

    How are you trying to create a Dominant value on the TXD (GPO2) pin?  Are you trying to send a CAN message, or force the TXD pin to a Dominant level through the Test register?

    Regards,

    Jonathan