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TCAN4550: Conduction Emission Failure

Part Number: TCAN4550

Hi team,

We have designed our product with two CAN ports located on the front panel. These ports are connected to each other during testing.

The CAN interface is implemented using the TCAN4550, which converts the MCU SPI interface to the CAN protocol. The schematic and layout were developed with reference to the TCAN4550EVM design.

During EMC compliance testing, we observed failures in the conducted emissions test (CISPR 32 Class A) when measurements were performed on the CAN port.

The CAN ports were interconnected using an unshielded CAT6A cable during the test. We would appreciate any guidance or recommendations regarding potential sources of emissions and possible mitigation techniques.

We have not mounted Common mode Choke (CMC) and Doesn't used any Y Cap.