TUSB216-Q1: USB Compliance J/K test fail (TUSB216-Q1)

Part Number: TUSB216-Q1
Other Parts Discussed in Thread: TUSB211-Q1

Dear TI experts,

My customer test TUSB216-Q1 using their own PCB.

In this process customer found that TUSB216-Q1 failed USB Compliance J/K test.

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During the USB compliance  J and K tests, the voltage levels on the D- and D+ pins are required to be within ±20 mV. However, with the active type A MCH connected, we are measuring approximately 107 mV on D- and 33 mV on D+, which is resulting in a certification failure.

Test J (D- in mV) = 106.1mV (in default configuration, active hub)

Test K (D+ in mV) = 33mV (in default configuration, active hub)

Test SE0_NAK (D+/D- in mV) = 34.3mV/34.8mV (in default configuration, active hub)

All tests are exceeded ±20 mV.

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And here are my questions;

  1. Can you check TID of TUSB216-Q1?
  2. Do you have any history of USB compliance test using TUSB216-Q1?
  3. My customer did not have an issue when they used TUSB211-Q1 before. Is there any difference between TUSB211-Q1 and TUSB216-Q1 which can affect J/K test?
  4. Do you have any ideas to solve the issue above?

Best regards,

Chase

  • Hi Chase,

    The TUSB216-Q1 should not be enabling during TEST_J/K, it should only enable during the TEST_PACKET compliance pattern. Can the customer monitor the CD and ENA_HS pins of the TUSB216-Q1 to verify whether the redriver is enabling or not?

    Can you check TID of TUSB216-Q1?

    We do not have a TID for the TUSB216-Q1

    • Do you have any history of USB compliance test using TUSB216-Q1?
    • My customer did not have an issue when they used TUSB211-Q1 before. Is there any difference between TUSB211-Q1 and TUSB216-Q1 which can affect J/K test?

    Is the customer using the CDP functionality of the TUSB216-Q1? If so, can the customer try disabling CDP functionality and seeing if that improves functionality? 

    TUSB211-Q1 only implements AC Boost, while the TUSB216-Q1 implements DC Boost, CDP functionality, and RX Sensitivity. DC_Boost or CDP functionality can have an effect if enabled, however I would not expect them to have an effect.

    Do you have any ideas to solve the issue above?

    Please have the customer test with different EQ levels to see if this has an effect.

    Ensure whether CDP is being used or not, if it is being used, test with it disabled.

    If the redriver is removed or held in reset, what is the voltage of D+/D- during TEST_J/K or SE0_NAK?

    Please monitor ENA_HS and CD during these tests to check if the redriver is enabled or not.

    Thanks,

    Ryan