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SN65LVDS179 tSK(PP) Information

Other Parts Discussed in Thread: SN65LVDS179

All,

I have a customer using the SN65LVDS179 that needs the Part-to-Part (process variation) skew. The older versions of the datasheet at least had a place holder for tSK(PP), but didn't have the numbers listed (for driver or receiver) but in the latest rev of the datasheet all mention was removed.

Is this something that is listed in other reports (Qual, etc.)?

Thanks in advance,

Joe

  • Hi Joe,

    Unfortunately, it looks like we don't have any data recorded on the part-to-part skew.  To get a very conservative estimate, you can take a look at the propagation delay specs for the driver and receiver.  Any device produced should have a propagation delay within the spec range, so the maximum possible skew should correspond to the maximum propagation delay spec.

    For a less conservative approach, you can take a look at Figure 13 through 16 in the "Typical Characteristics" section of the datasheet.  These curves plot the propagation delays for a typical device across temperature for various supply voltages.  The maximum values in the "Switching Characteristics" table account for temperature variation, power supply variation, and process variation; the "Typical Characteristics" plots only account for voltage and temperature.  If you subtract them, you can get a rough idea of how much the maximum spec is increased due to process.

    For example, the highest "typical" driver propagation delay occurs with a 3-V supply and maximum free-air temperature.  Its value is ~2.05 ns.  The maximum spec for this parameter is 2.7 ns, which means that there is a 0.65 ns increase when process variation is considered.  Assuming that the variance due to process shift is symmetrical (i.e., equal variance for both "weak" and "strong" process corners), the total part-to-part skew would be 2 * 0.65 ns = 1.3 ns.  A similar calculation could be done for the receiver, and would yield ~0.9 ns.

    Note that these results are "hand-wave" estimates, not guaranteed specs.  Given the device's age (it was released 14 years ago), the original pre-release characterization data is very difficult to come by.

    Regards,
    Max Robertson
    Analog Applications Engineer
    Texas Instruments
    m-robertson@ti.com

  • Thanks Max,

    I'll work through this with them,

    Joe