SN75DP139 Failure Question

cafain

Hi,

I can not understand the phenomenon of failure I, the analysis result content of TI.

According to TI result, the failure by Electrical Overstress (EOS) damage in the ESD of pin13(OUT_D4+).

I wants to know the relation between failure phenomenon and EOS damage in the ESD of pin13(OUT_D4+).

- My problem description: Output is not carried out for the signal of OUT_D1+/OUT_D1-(22,23pin), OUT_D2+/OUT_D2-(19,20pin), and an image is not displayed.

- Failure Analysis results by TI : The failure of caused by EOS damage in the ESD of pin13(Out_D4+)

- My question : How do you regard the causation of problem pin#(22,23 and 19,20) and EOS damage pin13(OUT_D4+)?

Best regards

over 11 years ago

0 Elias Villegas M. over 11 years ago

TI__Guru* 76130 points

Hello,

Do you have a Failure Analysis provided by TI?

Can you share it?

Can you send your schematic?

Regards.

0 cafain over 11 years ago in reply to Elias Villegas M.

Mastermind 6755 points

Hi.

I will send to the e-mail address of your request document.

Please tell me if there is information you need something.
Thank you for your support.

0 Elias Villegas M. over 11 years ago in reply to cafain

TI__Guru* 76130 points

Hello,

Please clarify the following:

Is this thread related only to understand the results of the QA analysis? Or are you still having issues on making the DP139 to work correctly?

A TMDS channel is comprised of 4 differential pairs, if one of them is not working you won't be able to establish a link.

It is also possible that the I/O cells of pin 22 and 23 converge with the pin 13 at some point making the device not functional when one of them is damaged, in this case you will have to go with your TI contact who provided you the QA analysis report.

Regards.

0 cafain over 11 years ago in reply to Elias Villegas M.

Mastermind 6755 points

Hi,

I thank you for your support.

Consult with people of TI Japan, check the content of trouble, you will be considered.

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SN75DP139 Failure Question