Hi,
I have a question about the device performance when C/Q pin is opened. We will use this device possibly under surge or/and transient in some period of time. But, the C/Q pin will be opened. I saw the comment at table 2 in the data sheet to describe this situation, and it is said failsafe output high. If under surge or/and transient, does it mean that the device might have false output high? Or, the output will be unpredictable?
Thanks, Best rgds,
Bon