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TLK10031: How does it test? Testing HS sides.

Part Number: TLK10031
Other Parts Discussed in Thread: TLK10034,

Hi, I want to test LS and HS lines seperatly. To do that, I want to learn how does the TLK10xxx device test. I have added a figure below to understand test logic clearly.

First of all, to test HS sides, I have to have 2 boards that has TLK10xxx device like these right? Because, transmitter side has generator, receiver side has verifier of each TLK10xxx. And both of them have to be in test mode. If yes, Is there any way to verify the HS side working correctly without doing external loopback on LS side?

  • Hi Ahmet,

    According to your block diagram, you would need 2 boards since this device is single channel. The TLK10031 is able to perform 3 kind of loopback: DEEP REMOTE, DEEP LOCAL & SHALLOW LOCAL. Please take a look into TLK10034 datasheet (Quad Channel version) 5.3.1.17 Section. In your case I would use the DEEP REMOTE loopback where the data is accepted on the high speed side receive SERDES pins (HSRX*P/N), traverses the entire receive data path, is returned through the entire transmit data path and sent out through the high speed side transmit SERDES pins (HSTX*P/N).

    I hope this helps.

    Best Regards,
    Luis Omar Moran
    High Speed Interface
    SWAT Team
  • Thanks for the quick answer. I also wonder the differences between 10G mode, 10G-KR/KX auto neg. and no auto neg modes. According to my diagram which mode should I use the TLK10031? My SFP+ transreceiver support 10G-LR.
  • Hello again Luis,

    Unfortunately, we are NOT able to access MDIO interface for now. However, I connected 2 board each other WITHOUT external loopback on LS sides like shown in figure. I drived PRBSEN pin HIGH and then I observed PRBS_PASS pin as HIGH when fibre cable connected. Whenever I plugged out fibre cable, PRBS_PASS pin goes LOW. Can I say that the test is successful and ready to work for real applications?

    And also I want to learn how PRBS test works. Is it really sending random data to test? If so, How the other device understands random data? If not, is there a standart for this test application? If yes, can you share the related document?

    I know, there is too many questions. Sorry about that :)

    Thank you again Luis, I look forward to your reply.