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TFP74x3 - What is AGING Generator?

Hello all,

I am studying a timing controllers of TI products, and I have a question with AGING Generator.

When I read a product review of TFP74x3 - TFT LCD PANEL TIMING CONTROLLER WITH MINI-LVDS AND FLATLINK, I don't have any clue about AGING in the document.

What is AGING in this chip? and why does this need?

Any advices and suggestions will be greatly appreciated.

Sincerely,

Jongmun

  • Jongmun,

    You have posted this question to the High Speed Data Converter forum. I have no idea what this part is. You may want to try posting this to another TI forum.

    Regards,

    Jim 

  • Jim,

    Thanks for reply.

    It converts a data sent through LVDS to mini LVDS data. That is why I wrote High Speed Data Converter forum.

    Can you recommend any other forum for my question if you don't mind? I am not sure which forum that I can write this question.

    Sincerely,

    Jongmun

  • Hi Jongmun,

    (Moved this to High Speed Interface Forum)

    Since the AGING Generator you inquired about is related to Display Panels, I'll limit the discussion to this type of application.  Seems the aforementioned TFP4723 was PREVIEWED in 2001, but never released, and there no related documentation for it.  Similar devices, the DS90UB94x-series, also has reference to an AGING function, related to cables, on page 1 of the datasheets:

    • Supports up to 15 Meters of Cable with Automatic Temperature and Aging Compensation

     Unfortunately, no details on how this is achieved.  I will see if we have any additional information about this feature, although it may take a few days.  I will update this thread with my findings by the end of the week.

    At your service,

    ~Leonard 

     

  • Hi Leonard,
    Thanks for finding the information. I'm looking forward to your reply.

    Sincerely,

    Jongmun
  • Hi Jongmun,

    As it turns out, the AGING generator was added to the TFP74xx design to provide a means to test the display, look for defects as the display panel aged.  It was not designed to be an active circuit that automatically compensated for FPD changes due to aging.  The designation might be misleading, and if you look at the datasheet (attached) page 4, you'll see an INput pin TEST.AGING. Page 7 describes the AGING pin operation, and pages 33-34 describe the operation.  It is there to simply generate test patterns, not to actively compensate for an aging or high-usage FPD.  

    And just for my information, I wasn't clear on if you are designing a new product, or researching the AG for information.  If designing a new product, I'm sure we can assist with any FPD interface required, as well as other design aspects. 

    ~Leonard   

     TFP74X3datasheet.pdf .