Part Number: TPD1E0B04DPYEVM
We recently purchased a TPD1E0B04DPYEVM to test the performance of the ESD diode before placing it in our design. We followed the test procedure as stated in the user manual except for a few deviations:
1. We generated the ESD strike while the tip of our ESD gun was on the trace between the SMA connectors, not directly on the center pin of J1. The tip of our ESD gun is too large to place directly onto the center pin.
2. We placed two 30 dB attenuators in line between J2 and the oscilloscope. This gives us a 1000:1 voltage division to protect our oscilloscope.
The clamping voltages we recorded were different than what the TPD1E0B04DPY datasheet claimed. We recorded a clamping voltage spike of +226 V on a +8kV strike while the datasheet claims that it should be clamped to about +102 V. We also recorded a clamping voltage spike of -234 V on a -8kV strike while the datasheet claims that it should be clamped to about -106 V.
I can provide pictures of our test set up and of the waveforms that are being generated if it helps.
Thank you!