• State TI Thinks Resolved
  • Locked Locked
  • Replies 1 reply
  • Answers 1 answer
  • Subscribers 33 subscribers
  • Views 472 views
  • Users 0 members are here
Support feedback
Options
Options
Related

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

SN6501-Q1: SN6501QDBVRQ1 used in ISO 26262 application

Tor Hansen
Prodigy 120 points
Part Number: SN6501-Q1

Dear TI,

We are using the SN6501QDBVRQ1 in a ISO26262 application. The SN6501QDBVRQ1is automotive qualified, but not ISO26262, is there a set of failure modes/distribution and a FIT TI recommends for this or do you recommend some other approach?

 

Best regards / Med venlig hilsen

LiTHIUM BALANCE A/S

 

Tor Friis Hansen

 

PROJECT MANAGER | R&D | Electrical Engineering

LiTHIUM BALANCE A/S, Hassellunden 13, DK-2765 Copenhagen, Denmark

Mobile: +45 2275 7627 |Skype: TorFriisHansen| Office: +45 5851 5104

Mail: torfriis@lithiumbalance.com | Web: www.lithiumbalance.com

Battery Management Systems | Electric and Hybrid Applications | System Integration

  • 0
    TI__Intellectual 1260 points

    Dear Tor,

    Thank you for using the TI E2E Froum!

    We we do not have an ISO26262 compliant failure document for the SN6501QDBVRQ1.

    But you can use the DPPM/FIT/MTBF estimator on ti.com to get a estimate of the FIT.

    For the following SN6501QDBVRQ1 fit is estimated:

    Early life failure rateMTBF / FITEarly life failure rate supporting dataMTBF / FIT supporting data
    Part numberELFR-DPPMMTBFFITConf level (%)Test temp (°C)Sample sizeFailsUsage temp (°C)Conf level (%)Activation energy (eV)Test temp (°C)Test duration (hours)Sample sizeFails
    SN6501QDBVRQ1 17 4.73x 10 9 0.2 60 125 55128 0 55 60.0 0.7 125 1000 55288 0


    I hope this solves your question.

    Let me know if you need further details.
    More calculators and info can also be found on the reliability secion ti.com.

    Best Regards,
    Matthias

    Table legend:
    Definition of Table Terminology
    Part #:The TI orderable part number
    ELFR: Early Life Failure Rate
    DPPM: Defective Parts Per Million
    MTBF: Mean Time Between Failures
    FIT: Failures-in-Time. The number of failures per 1E9 device-hours
    Conf level %: Statistical confidence level
    Test temp (°C): Temperature at which the stress test is performed
    Sample size: Sample size is how many units were tested and would be based on the normalized value for duration
    Fails: The number of failures per test
    Usage temp (°C): Estimated usage temperature
    Activation energy (eV): Energy in electron volts (eV) for a particular process to occur
    Test duration (hrs): Test duration is a field that comes from the qualification testing of a product. Since more than one test is conducted and the duration varies, this field will be normalized based on calculations using temp, quantity and fails. This value would be equivalent unit hours.
    NA: Not Applicable
    TBD: To Be Determined