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DP83822I: FLP burst and 10BASE-Te test

Part Number: DP83822I

Hi Hung,

As you replied at following thread, FLP burst is generated with using line driver with 10BASE-Te. For that case, do you think line driver operation of 10BASE-Te will work if FLP communication works well between local and link partner? The customer tries to skip 10BASE-Te test reasonably or looks for alternative way. Does TI have any block diagram for line driver of 10BASE-Te to see if it works through FLP burst? Thank you for your support, 

https://e2e.ti.com/support/interface/f/138/p/763700/2823104?tisearch=e2e-quicksearch&keymatch=dp83822i%20line%20driver#2823104

Best regards,

Takeshi Sasaki