This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

DP83867E: Built In Self Test (BIST) Thread

Part Number: DP83867E
Other Parts Discussed in Thread: USB-2-MDIO

Hello,

I work for a CM and a board we're working on uses the DP83867ERGZT Ethernet PHY IC. We need to test the functionality of this chip using the BIST described in the device's datasheet and would like to know if it's possible to complete the BIST entirely through the RJ45 JTAG interface without access to the MAC (which in this application is a Xilinx FPGA) or a clock signal provided to the chip's XI pin. Please let me know what you think.

- Alden