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TLIN1029-Q1: Break delimiter bit time ISSUE

Part Number: TLIN1029-Q1

Hi

The customer uses TLIN1029-Q1.

This is the issue generated during the LIN Conformal Test, when a new LIN Frame (Message) is sent, 1 bit (or more bits) is configured as Break Field (Break + Break Delimiter) at the beginning of the frame.

As a result of the test, Break Delimiter in Break field should be 1bit (or more bits) – 52.08 usec, but it is measured at 0.93 bit – 48.46 usec.

Is there a way to increase break delimiter bit time?

  • Cho,

    Thanks for bringing this question to E2E. Since the TLIN1029-Q1 is a transceiver that merely translates the logic signals from the LIN controller to the LIN bus waveform, it doesn't have a lot of control over the bit width here. This would need to be handled at the controller and protocol side of the system.

    Is it possible to share waveforms of this occurring? It would be good to capture TXD, LIN and RXD on the same screenshot. I want to see if there's any skewing from TXD to LIN to RXD.

    Regards,

  • Eric,

    Thank you for your support.

    Waveforms capturing TXD, LIN, and RXD at the same time were requested.

    Is there any way to improve H/W?

    Please check if there is a way to reduce break delimiter time in the schematic.

  • Cho,

    Thank you for the LIN waveform, there doesn't look to be anything wrong from a signal integrity standpoint. I can't tell the value of the capacitors on the LIN pins, but again, I don't see any issue with the LIN waveform. Once we get screenshots of TXD, LIN, and RXD this will help to understand. We need to make sure that the TXD bit width is wide enough to support the break delimiter as it gets translated into the LIN signal.

    And to comment on the schematic, there's nothing that is incorrect, but if you could share the capacitor values on the TXD and LIN pins, that would help. Also, is the VSUP voltage?

    Regards,