• State
  • Locked Locked
  • Replies 4 replies
  • Subscribers 33 subscribers
  • Views 331 views
  • Users 0 members are here
Support feedback
Options
Options
Related

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

DP83TC811R-Q1: Device is not meeting with IEEE 1149.1 Standard - But need to add some boundary scan test coverage.

6183562
Prodigy 10 points
Part Number: DP83TC811R-Q1
Other Parts Discussed in Thread: DP83TC811,

TI support team is confirming that devices DP83TC811SWRNDRQ1-100BASE-T1 PHY A1 RTM and DP83TC811RWRNDRQ1 - 100BASE-T1 PHY RGMII AEC-Q100 are not intended to support Boundary Scan test and no other versions of these devices will be released to meet IEEE 1149.1. Is there some thing else that can be done with boundary scan test to add coverage on these devices?.

I appreciate any inputs.

Thank you.

  • 0
    TI__Expert 5425 points

    Hello,

    The DP83TC811 supports boundary scan test, as it has a JTAG interface. There is also a BSDL file available for use with a JTAG emulator. It is in the design tools section of the product page.

    Regards,

    Adrian Kam

  • 0 in reply to Adrian Kam
    Prodigy 10 points

    Adrian,

    Hello.

    I kindly appreciate your answer.

    As per your previous comment , it seems like only because a device has a BSDL and a JTAG interface does not make the device compliant. Based on our observations, the TDO signal is not being updated on the falling edge of TCK as per Rule 4.5.1a of IEEE 1149.1-2001.

    There is a Texas Instruments patent: US 8,301.946 B2: “Inverted TCK Access Port Selector With Normal TCK Data Flip-Flop Access”.

    I´m not sure, but perhaps these DP83TC811R-Q1 device carry this patent, it looks like there is some workaround which may be researched in order to try solving this device TDO issue in regards of  IEEE 1149.1-2001, were it is mentioned that "Changes in the state of the signal driven through TDO shall occur only on the falling edge of TCK".

    So far today, it is impossible to know how to make them fit within the standard.

    I appreciate any inputs on this regard?

    Thank you.

  • 0 in reply to 6183562
    TI__Expert 5425 points

    Hello,

    Let me consult with my team internally, and I can get back to you when I get a response from them. Hopefully, I can get a response by Monday, but if not, I will reply to this thread with an update.

    Regards,

    Adrian Kam

  • 0 in reply to Adrian Kam
    TI__Expert 5425 points

    Hello,

    For the standard that the TDO signal should pulse at the falling edge of the TCK, the construction of the JTAG module should meet the standard.

    Regards,

    Adrian Kam