SN74AHCT244: question about qual data

Hi Tim,

I'll look into this and get back to you.

Hey Tim,

Can you share the qual document that you have? You can email me directly if you don't want to post here -- I'm Emrys (at) ti.com

Hi TIm,

The answers I got back from our quality team:

1. Was a c-SAM performed

No.

2. Was a DPA performed

Unknown what "DPA" means.

3. During the RH testing for 1000 hours, was the device powered or unpowered?

Unpowered.

4. was the part powered for the whole 1000s or an on/off profile setup?

N/A (unpowered).

5. For operating life static test, it looks like it is powered during this test section is that true

Yes, it is powered.

6. In the qual report sent , it likes like TI is qualifying AHCT244DW by similarity to ACT240DW. I was asked how AHCT244DW is qual by sim to ACT240DW . What is the justification that allows TI to qual by sim to ACT240DW

Both devices are built on the same technology and have similar die sizes.

Emrys Maier said:

2. Was a DPA performed

A DPA is Destructive Physical Analysis performed on electronic components and materials use in aerospace, commercial , military and government applications. If you are not familiar with DPAs, I am guessing the answer is no.

Can you double check, and respond Yes or No to question 2? if yes, can we get a report number?

It's possible that the engineer just wasn't familiar with the acronym. I'll ask.

The answer I got back was "no" -- we only do a physical teardown of a device when a failure has been submitted to us. It's not part of our usual qualification.