This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

SN54AC14: About non RHA(-) details

Part Number: SN54AC14

Tool/software:

I am seeking clarification regarding the difference between the two types of parts identified as 5962-8762401DA and 5962F8762401DA. Specifically, I would like to understand the following:

  1. What are the differences between the (-) part and the (F) part?

  2. It is understood that the (F) part and the (-) part are the same device (die revision/package), but are there any flows or processes that differ from standard process manufacturing for lot selection, testing, and manufacturing to produce (F) parts? If there is any difference in manufacturing process distinguishing the two parts?

To be more specific, the current lot-based assurance seems to exceed the program requirement of my project.

Since our application does not involve environments sensitive to Total Ionizing Dose (TID), we are considering whether the lot-level radiation margin of 300krad for the F part is necessary.

Therefore, I would like to confirm some level of confidence based on the reliability of the manufacturing process and material quality to ensure that it is acceptable for use.

Could you provide any available data on the TID endurance of the standard (-) part, such as test reports or characteristics of the die?

I understand that Radiation Hardness Assurance (RHA) is not applicable to the standard part.

However, if the manufacturing process and materials are the same, I thought it may be suitable for application in a less senstive(<10krad) space environmnet, so I inquired to confirm the accuracy.

Best regards.

  • Hi Jung,

    I am a bit confused where you are seeing the (F) device. These are the available devices. 

  • I apologize for any confusion.
    Could I ask the same question regarding the following two components?

    5962-9553601QPA / 5962F9553601VPA (Please disregard the differences related to QML Q and V grades)

    As mentioned in my previous inquiry, if these are the same device and used in a mission where a 300krad tolerance guarantee is not required, could you please let me know if there would be any additional benefits or effects expected?

    I would like to clarify mu understanding if there are any significant differences in the process or manufacturing between the grades (-/F) that might affect my consideration as mentioned earlier.

    Additionally, regarding the component 5962-8762401DA, while I understand that SEL characteristics are confirmed at 93 MeV, would there be any TID test data available for reference?

    Thank you very much for your assistance.

  • Hi Jung,

    That difference is the RHA rating see

    from slvaeu1.

    The primary difference will be the testing that these devices go through, and the guarantees TI can make on performance. If using a non 300 krad device in 300 krad environment and the device fails there is not much we can do to support as the device is being operated outside it's intended environment.

    Electrically these devices will handle the same.

    For access to test data please reach out to the ti customer support center https://www.ti.com/info/customer-support.html as we can't share that on public forums 

    Regards,

    Owen

  • Could you please provide information regarding the radiation testing related to the components I inquired about?

    For your reference, I was advised by Jonard Rico to raise additional questions in the E2E forum.

  • Hi Jung,

    I have dug around a bit and cannot find any radiation data for this device. 

    Unfortunately for older parts such as these, there is no documentation available. 

    Closest thing I can find is the radiation test for the SN54AC00-SP device. These are different dies, however, so use this information at your own risk. 

    https://www.ti.com/product/SN54AC00-SP