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Tool/software:
I would like to enquire about the input resistive characteristics for the SN74LVC1G125. Are the inputs ( A or OE) connected to VCC through a diode ( similar to the LV family) or any other circuitry? If yes, what is the expected resistance measurement ?
Hi Petrone,
You can see if a device has any internal diode in the circuitry by reading through this FAQ:
For input resistance refer to this FAQ;
Hello Albert,
I've looked at the application note and the LVC does not seem to have a positive clamp diode ( the LV family does) and we're seeing characteristics as if the LVC series also has the positive clamp diode. We have 20 of these buffers in parallel, which is giving us a 30k resistance ( forward bias of ~ 600kohm per /device). Figure 3 in this application note.
Is this expected from the LVC series?
LVC does not have positive clamping diodes.
A diode does not have a constant resistance.
Please specify how exactly you are observing or measuring the resistance.
Hello Clemens,
When measuring resistance from (DMM+ probe) VIN and GND ( Connected together in our configuration to VCC (DMM- probe) of 20 of these devices in parallel we see a constant ~30kOHM resistance. However, when we swap the probe (DMM+ on VVCC and DMM-* on VIN/GND) we measure an open circuit. Almost diode "like" behavior..
As far as I can see, you are measuring the GND clamping diode. In the DMM's diode test mode, you should see the forward voltage of about 0.7 V. Please note that logic devices usually use a p-type silicon substrate that forms diodes to all components on the die; the GND voltage should never be more positive than any other voltage.