SN74LVC2GU04: SN74LVC2GU04

Johnson Li

Other Parts Discussed in Thread: SN74LVC2GU04

Tool/software:

Dears,

follow this link [FAQ] Can I connect two outputs from a CMOS logic device together directly? - Logic forum - Logic - TI E2E support forums

We used 2 channels inside a same package.and use this to have a oscillate to drive a load >75mA. the frequency is 1Mhz.

but refer to below internal structure. if the output 6 and output 4 have a delay, and output 6 is high,output 4 is low.

i means internal parastic , for instance, parastic capacitor.

then could be a ns have a short. how to evaluate whether damage exist?

Would you please help me to think about whether there could be a damage inside as my circuit?

Thank you

3 days ago

0 Ian Graham 3 days ago

TI__Genius 9851 points

Hi,

Whether the part would be damaged would depend on the current through the device. I would expect the delay difference between the channels to be low enough that the current through the device to be less than the maximum, and therefore not damage the part, but TI does not guarantee this spec. I recommend testing the Icc with an ammeter experimentally and verifying Icc<100mA.

0 Johnson Li 2 days ago

Prodigy 20 points

Hello Ian,

Thanks for your reply, i will follow below steps;

1. take 2 or 3 circuit;

2. measure the Icc of each SN74LVC2GU04;

3. record the maximum current of each SN74LVC2GU04;

4. use osillcope measure more than 1hours(set single trip mode), better together with current probe and voltage probe.

below is oscillscope parameter.

if there is no peak current more than 100mA within 1hours. we can think there is no abnormal damage inside.

Am I right?

Do you have any other suggestion?

Best Regards

+1 Ian Graham 1 day ago in reply to Johnson Li

TI__Genius 9851 points

Hi,

Yes, that's correct.