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SN54SC4T08-SEP: Use of Open Outputs for Test

Berkay Dean
Prodigy 10 points

Part Number: SN54SC4T08-SEP

I am an RHA engineer planning a supplementary SEL test to a higher LET for this device. I am currently designing a test circuit, and I am cross-referencing the available SEL test report "SN54SC4T08-SEP Single-Event Latch-Up (SEL) Radiation Report". The outputs of each channel are shown to be left open (floating). 

Can you please provide some insight into why this was chosen over a capacitive or resistive load? Was this determined to be the worst case circuit setup?

sbok078.pdf