Is there metastability data available specific to the 74LVC1G175?
I have seen a TI PowerPoint slide showing the LVC family with relatively good metastability behavior (fast recovery). Surprisingly the LV family is shown with very poor metastability behavior - so fast tpd does not always equal good metastability.
The single gate devices seem to have very different specs from the multi-gate members of the LVC family.
Does the 74LVC1G175, specifically, share this "good" behavior of the LVC family?