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LSF0204 - Context for Testing Max Propagation Delay

Other Parts Discussed in Thread: LSF0204

Hi!

For my application, I will be translating 1.8V to 3.3V at 12 MHz. I need my propagation delay to be less than 1.5 ns.

According to the product folder for LSF0204, the maximum propagation delay is less than 1.5 ns.

However, looking at Section 8.8 (page 6) in the LSF0204 datasheet, it shows a max propagation delay of 5.13/5.3 ns, which is worse than the typical values shown and the value listed in the product folder.

Can anyone describe the testing scenario for the maximum propagation delay?

In this post (), the max propagation delay seems to come from process and temperature variation.

To accomplish this, will the part need to be temperature controlled?

Does temperature or process variations dominate the delay?

Is C(load) used here during testing to simulate trace capacitance?

How can I guarantee that my propagation delay is low here?

Thanks for your help in advance!!

James

  • Hi James, check out section 9.1 for information on how those parameters were tested.

    "TPD" is the worst-case of TPLH and TPHL. I think temperature variation is going to be more influential than process. I will check with our test engineer to see how those typicals and maximums were determined.