Hi,
I need to obtain a process variation figure for the SN74LVC8T245 device.
Using the LVC Characterization Information (SCBA011 December 1996) I have been able to derive robust temperature and supply voltage variation figures (Kt and Kp).
However, I cannot find any information relating to process variation. Using some min and max gate delay figures from the datasheet, I have generated Kp values of 0.1 to 1.9, but these are far too severe IMO.
Do you have any process variation data, or graphs from which I could derive this information?
With thanks,
Karl