Dear Specialists,
My customer is considering CD4050 and has questions about device function test.
I would be grateful if you could advise.
---
We'd like to conduct a kind of stress test(thermal, shock and etc) and confirm deterioration of the device.
We perform a simple test of the device before and after the examination and confirm the difference.
I picked up specific items.
Are these items sufficient?
・IDD(Max) Quiescent device current
・IOL(Min) Output low (sink) current
・IOH(Min) Output high (source) current
・VOL(Max) Out voltage low level
・VOH(Min) Output voltage high level
・VIL(Max) Input low voltage
・VIH Input high voltage
・Propagation delay time Low to high
・Propagation delay time High to low
Could you please provide the test circuit your recommend.
---
I appreciate your great help in advance.
Best regards,
Shinichi